杂志简称：int j rf microw c e
中文译名：《国际射频和微波计算机辅助工程期刊》
收录属性：scie（2024版）, 目次收录（知网）,英文期刊,
自引率：34.50%
投稿方向：工程技术、computer science, interdisciplinary applications计算机、跨学科应用、engineering, electrical & electronic工程、电子与电气
SCI/E期刊基本信息
出版周期：月刊 地区：美国
中科院分区：4区
是否TOP：非TOP期刊
是否综述：非综述期刊
是否OA：非OA期刊
国际标准刊号：ISSN 1096-4290；EISSN 1099-047X
杂志语言：英语
出版国家：美国
杂志官网 联系方式
出版地址：JOHN WILEY & SONS INC,111 RIVER ST,HOBOKEN,USA,NJ,07030
杂志邮箱：
投稿网址：https://wiley.atyponrex.com/journal/MMCE
杂志官方网址：https://onlinelibrary.wiley.com/journal/1099047x
出版商网址：http://www.wiley.com/WileyCDA/
杂志投稿要求
投稿须知【杂志社官方网站信息】
International Journal of RF and Microwave Computer-Aided Engineering
AUTHOR GUIDELINES
1. SUBMISSION
Authors should kindly note that submission implies that the content has not been published or submitted for publication elsewhere except as a brief abstract in the proceedings of a scientific meeting or symposium.
Once the submission materials have been prepared in accordance with the Author Guidelines, submissions should be made via the Research Exchange submission portal available here. Should your manuscript proceed to the revision stage, you will be directed to make your revisions via the same submission portal. You may check the status of your submission at anytime by logging on to submission.wiley.com and clicking the “My Submissions” button. For technical help with the submission system, please review our FAQs or contact submissionhelp@wiley.com.
PLEASE ENSURE ALL CO-AUTHOR NAMES AND DETAILS ARE INCLUDED IN THE MANUSCRIPT. AUTHORS CANNOT BE ADDED OR REMOVED ONCE AN ARTICLE HAS BEEN ACCEPTED FOR PUBLICATION.
DATA PROTECTION
By submitting a manuscript to or reviewing for this publication, your name, email address, and affiliation, and other contact details the publication might require, will be used for the regular operations of the publication, including, when necessary, sharing with the publisher (Wiley) and partners for production and publication. The publication and the publisher recognize the importance of protecting the personal information collected from users in the operation of these services, and have practices in place to ensure that steps are taken to maintain the security, integrity, and privacy of the personal data collected and processed. You can learn more at https://authorservices.wiley.com/statements/data-protection-policy.html.
PREPRINT POLICY
Wiley believes that journals publishing for communities with established pre-print servers should allow authors to submit manuscripts which have already been made available on a non-commercial preprint server. Allowing submission does not, of course, guarantee that an article will be sent out for review. It simply reflects our belief that journals should not rule out reviewing a paper simply because it has already been available on a non-commercial server. Please see below for the specific policy language.
However, Wiley also knows that the use of preprint servers is not universally accepted and that individual journals and/or societies may approach submission of preprints differently.
This journal will consider for review articles previously available as preprints on non-commercial servers such as ArXiv, bioRxiv, psyArXiv, SocArXiv, engrXiv, etc. Authors may also post the submitted version of a manuscript to non-commercial servers at any time. Authors are requested to update any pre-publication versions with a link to the final published article.
2. AIMS AND SCOPE
International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology.
Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to:
• Computer-Aided Modeling
• Computer-Aided Analysis
• Computer-Aided Optimization
• Software and Manufacturing Techniques
• Computer-Aided Measurements
• Measurements Interfaced with CAD Systems