Microelectronics Reliability《微电子学可靠性》（月刊）. Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
杂志简称：microelectron reliab
中文译名：《微电子学可靠性》
收录属性：scie（2024版）, 目次收录（知网）,英文期刊,
投稿方向：工程技术、engineering, electrical & electronic工程、电子与电气、nanoscience & nanotechnology纳米科技、physics, applied物理、应用
SCI/E期刊基本信息
出版周期：月刊 地区：英国
中科院分区：4区
是否TOP：非TOP期刊
是否综述：非综述期刊
是否OA：非OA期刊
国际标准刊号：ISSN 0026-2714；EISSN 1872-941X
杂志语言：英语
出版国家：英国
杂志官网 联系方式
出版地址：PERGAMON-ELSEVIER SCIENCE LTD ,THE BOULEVARD,LANGFORD LANE,KIDLINGTON,OXFORD,ENGLAND,OX5 1GB
杂志邮箱：
投稿网址：https://www.editorialmanager.com/micrel
杂志官方网址：https://www.sciencedirect.com/journal/microelectronics-reliability
出版商网址：http://www.elsevier.com
杂志投稿要求
刊知网提示：
1、投稿方式：进入官网系统在线投稿。
2、杂志网址：https://www.sciencedirect.com/journal/microelectronics-reliability
3、投稿网址：https://www.editorialmanager.com/micrel
4、出版周期：月刊，一年出版12期。
刊知网 精心整理，转载请注明出处：https://www.kanzhiwang.com/archives/36186
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